This book will explain how to verify SoC logic designs using "formal" and "semi-formal" verification techniques. The critical issue to be addressed is whether the functionality of the design is the one that the designers intended. Simulation has been used for checking the correctness of SoC designs (as in "functional" verification), but many subtle design errors cannot be caught by simulation. Recently, formal verification, giving mathematical proof of the correctness of designs, has been getting much more attention. So far, most of the books on formal verification target the register transfer level (RTL) or lower levels of design. For higher design productivity, it is essential to debug designs as early as possible. That is, designs should be completely verified at very abstracted design levels (higher than RTL). This book covers all aspects of high-level formal and semi-formal verification techniques for system level designs.
- First book that covers all aspects of formal and semi-formal, high-level (higher than RTL) design verification targeting SoC designs.
- Formal verification of high-level designs (RTL or higher).
- Verification techniques are discussed with associated system-level design methodology.

This book describes the state of the lay participation system in criminal justice, saiban-in seido, in Japanese society. Starting with descriptions of the outlines of lay participation in the Japanese criminal justice system, the book deals with the questions of what the lay participants think about the system after their participation, how the general public evaluate the system, whether the introduction of lay participation has promoted trust in the justice system in Japan, and the foci of Japanese society's interest in the lay participation system. To answer these questions, the author utilizes data obtained from social surveys of actual participants and of the general public. The book also explores the results of quantitative text analyses of newspaper articles. With those data, the author describes how Japanese society evaluates the implementation of the system and discusses whether the system promotes democratic values in Japan.

This book describes the state of the lay participation system in criminal justice, saiban-in seido, in Japanese society. Starting with descriptions of the outlines of lay participation in the Japanese criminal justice system, the book deals with the questions of what the lay participants think about the system after their participation, how the general public evaluate the system, whether the introduction of lay participation has promoted trust in the justice system in Japan, and the foci of Japanese society's interest in the lay participation system. To answer these questions, the author utilizes data obtained from social surveys of actual participants and of the general public. The book also explores the results of quantitative text analyses of newspaper articles. With those data, the author describes how Japanese society evaluates the implementation of the system and discusses whether the system promotes democratic values in Japan.

This book contains extended and revised versions of the best papers presented at the 26th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2018, held in Verona, Italy, in October 2018. The 13 full papers included in this volume were carefully reviewed and selected from the 27 papers (out of 106 submissions) presented at the conference. The papers discuss the latest academic and industrial results and developments as well as future trends in the field of System-on-Chip (SoC) design, considering the challenges of nano-scale, state-of-the-art and emerging manufacturing technologies. In particular they address cutting-edge research fields like heterogeneous, neuromorphic and brain-inspired, biologically-inspired, approximate computing systems.

This book describes techniques for how to verify and debug VLSI designs when bugs are found after the chips are fabricated and used in the field. This is the first book to cover many aspects of post-silicon verification and debugging techniques that utilize high-level design information, such as design descriptions in C/C++. Using high-level analysis on the error traces generated by fabricated chips maximizes the efficiency of the verification and debugging techniques presented in this book. Experimental results are included for real applications of the techniques presented.